Aberration Corrected Electron Microscopes
New Tools in the Shared Experimental Facilities

The Center for Nanoscale Systems (CNS) at Harvard has commissioned aberration corrected scanning and transmission electron (STEM and TEM) microscopes. The Zeiss Libra 200KV monochromated aberration corrected (STEM) has a resolution of 0.09 nm along with the analytical capability of energy filtered spectroscopy and energy dispersive X-ray study and the Libra 200 MC TEM offers a resolution down to 0.074 nm. These instruments are the only aberration corrected electron microscopes available in the Northeast. Dr. David C. Bell, senior microscopist, is shown here during a hands-on session with the Libra STEM at the recent Aberration Corrected Electron Microscopy workshop that introduced area researchers to the new capabilities of these shared experimental tools for materials analysis. The aberration corrected electron microscopes are available to researchers locally and nationally through the NSF/NNIN program.

David A. Weitz (Physics & Applied Physics)
Cynthia M. Friend (SEAS)
Harvard MRSEC (DMR-1420570)